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Proceedings Paper

Terahertz polarization conversion of metallic meanderline structures on the different thickness of polymide substrates
Author(s): Chang Gu; Guozhong Zhao; Ruirui Huang; Kuan Kou
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Paper Abstract

In this paper, we have investigated the polarization dependence of terahertz wave through the metallic meanderline structure on the different thicknesses of polyimide substrate. The meanderline wave plates are designed by using software of CST Microwave Studio. The 200 nm thickness of gold film is used as metallic layer deposited on the polyimide substrate with different thicknesses. The ellipticity η is obtained by the simulating transmission and phase, η=0 corresponds to linearly polarized transmission, while η=1 and -1 corresponds to left-handed and right-handed circular polarization. The intermediate value of η indicates the elliptically polarization. The simulation results show that the absolute value of ellipticity reach the maximum of 0.999 at 0.505THz, 0.479THz and 0.391THz when the substrate thickness t=10μm, 30μm and 60μm, respectively. In addition, the metallic microstructure of meanderline displays a large bandwidth of THz operation. The ellipticity is over 99% in the THz band of 457 GHz to 532 GHz, 426 GHz to 508 GHz, 356 GHz to 486 GHz corresponding to the above three kind of substrate thicknesses. The bandwidth increases and shows red shift with increasing of substrate thickness. These results provide a reference for the design and manufacture of THz polarization conversion device.

Paper Details

Date Published: 11 November 2014
PDF: 6 pages
Proc. SPIE 9275, Infrared, Millimeter-Wave, and Terahertz Technologies III, 92750L (11 November 2014); doi: 10.1117/12.2073956
Show Author Affiliations
Chang Gu, Capital Normal Univ. (China)
Beijing Key Lab. of Terahertz Spectroscopy and Imaging (China)
Beijing Key Lab. of Terahertz Optoelectronics (China)
Guozhong Zhao, Capital Normal Univ. (China)
Beijing Key Lab. of Terahertz Spectroscopy and Imaging (China)
Beijing Key Lab. of Terahertz Optoelectronics (China)
Ruirui Huang, Capital Normal Univ. (China)
Beijing Key Lab. of Terahertz Spectroscopy and Imaging (China)
Beijing Key Lab. of Terahertz Optoelectronics (China)
Kuan Kou, Capital Normal Univ. (China)
Beijing Key Lab. of Terahertz Spectroscopy and Imaging (China)
Beijing Key Lab. of Terahertz Optoelectronics (China)


Published in SPIE Proceedings Vol. 9275:
Infrared, Millimeter-Wave, and Terahertz Technologies III
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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