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Proceedings Paper

Matching method of the vision image captured by the lunar rover exploring on lunar surface
Author(s): Lichun Li; Jianliang Zhou; Jun Sun; Desheng Shang; Yinghui Xu; Wei Zhang; Wenhui Wan
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Paper Abstract

Facing the lunar surface survey of the Lunar Exploring Engineering, the paper summarizes the environment sensing technology based on vision image. For the image matching is the most important step in the process of the lunar exploring images, the accuracy and speed of the matching method is the key problem of the lunar exploring, which play an important role in the rover auto navigating and tele-operating. To conquer difficult problem that there are significant illumination variation of the imaging, lack of image texture, and non-uniform distribution of the image texture, the huge change of the disparity for the prominent target in the scene, in the image process Engineering, the image matching method is proposed which divided the whole image into M×N regions, and each region employs the Forstner algorithm to extract features, by which the semi-uniform distribution features of whole image and avoiding of the features gathering is achieved. According to the semi- uniform distribution features, the Sift and Least Square Matching method are used to realize accurate image matching. Guided by the matched features of the first step, the locale plane is detected to restrict dense image registering. The matching experiments show that the method is effective to deal with the image captured by the lunar exploring rover, that has large variation of illumination and lacking of image texture. The robustness and high accuracy of the method is also proved. The method satisfied the request of the lunar surface exploring.

Paper Details

Date Published: 13 November 2014
PDF: 7 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 927605 (13 November 2014); doi: 10.1117/12.2073717
Show Author Affiliations
Lichun Li, Beijing Aerospace Control Ctr. (China)
Jianliang Zhou, Beijing Aerospace Control Ctr. (China)
Jun Sun, Beijing Aerospace Control Ctr. (China)
Desheng Shang, Beijing Aerospace Control Ctr. (China)
Yinghui Xu, Beijing Aerospace Control Ctr. (China)
Wei Zhang, Beijing Aerospace Control Ctr. (China)
Wenhui Wan, Institute of Remote Sensing and Digital Earth, Chinese Academy of Sciences (China)

Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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