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Proceedings Paper

Terahertz properties of metallic checkerboard patterns and related structures
Author(s): Yoku Tanaka; Keisuke Takano; Yuichiro Okui; Abdallah Chahadih; Abbas Ghaddar; Xiang-Lei Han; François Vaurette; Tahsin Akalin; Fumiaki Miyamaru; Willie J Padilla; Masanori Hangyo
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Paper Abstract

A critical electromagnetic response of a self-complementary structure was investigated. The nearly perfect selfcomplementary checkerboard patterns were fabricated by the electron-beam lithography and their electromagnetic responses are measured in the terahertz region. The electromagnetic responses are affected drastically by the small structural difference even though the differences are less than 0.1% of the wavelength of the incident electromagnetic waves. The sample most close to the self-complementary checkerboard pattern shows a less frequency dependent response, which is expected for the self-complementary structures. In this sample, the metallic squares seem to be connected randomly from the SEM observation. The effect of the structural randomness in metal mesh structures is also investigated to obtain the common electromagnetic properties in randomly connected systems.

Paper Details

Date Published: 11 November 2014
PDF: 6 pages
Proc. SPIE 9275, Infrared, Millimeter-Wave, and Terahertz Technologies III, 92750B (11 November 2014); doi: 10.1117/12.2073672
Show Author Affiliations
Yoku Tanaka, Osaka Univ. (Japan)
Keisuke Takano, Osaka Univ. (Japan)
Yuichiro Okui, Osaka Univ. (Japan)
Abdallah Chahadih, Univ. des Sciences et Technologies de Lille (France)
Abbas Ghaddar, Univ. des Sciences et Technologies de Lille (France)
Xiang-Lei Han, Univ. des Sciences et Technologies de Lille (France)
François Vaurette, Univ. des Sciences et Technologies de Lile (France)
Tahsin Akalin, Univ. des Sciences et Technologies de Lille (France)
Fumiaki Miyamaru, Shinshu Univ. (Japan)
Willie J Padilla, Boston College (United States)
Masanori Hangyo, Osaka Univ. (Japan)

Published in SPIE Proceedings Vol. 9275:
Infrared, Millimeter-Wave, and Terahertz Technologies III
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

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