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Proceedings Paper

Contribution of the metrology to the study of laser induced damage with multiple longitudinal mode pulses
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Paper Abstract

With the purpose of understanding nanosecond laser induced damage mechanisms when working with multiple longitudinal mode pulses, an accurate measurement of the temporal profiles is required. In this study, the use of a streak camera with a wide bandwidth is justified through the knowledge of the Nd:YAG spectral characteristics. A statistical and phenomenological analysis of multiple longitudinal modes intensity profiles is then performed through experiments and modeling. The resolution limitation of our photodiodes is also discussed.

Paper Details

Date Published: 22 September 2014
PDF: 4 pages
Proc. SPIE 9238, Pacific Rim Laser Damage 2014: Optical Materials for High-Power Lasers, 92380I (22 September 2014); doi: 10.1117/12.2073237
Show Author Affiliations
R. Diaz, Commissariat à l'Énergie Atomique, CESTA (France)
M. Chambonneau, Commissariat à l'Énergie Atomique, CESTA (France)
R. Courchinoux, Commissariat à l'Énergie Atomique, CESTA (France)
J. Luce, Commissariat à l'Énergie Atomique, CESTA (France)
J.-Y. Natoli, Aix Marseille Univ., CNRS, Institut Fresnel (France)
L. Lamaignère, Commissariat à l'Énergie Atomique, CESTA (France)


Published in SPIE Proceedings Vol. 9238:
Pacific Rim Laser Damage 2014: Optical Materials for High-Power Lasers
Takahisa Jitsuno; Jianda Shao; Wolfgang Rudolph, Editor(s)

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