Share Email Print
cover

Proceedings Paper

Freeform metrology based on phase retrieval and computer-generated hologram
Author(s): Fa Zeng; Qiaofeng Tan; Yi Liu; Huarong Gu; Zhehai Zhou; Guofan Jin
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Recently, interferometric null-testing with computer-generated hologram has been proposed as a non-contact and high precision solution to the freeform optics metrology. However, the interferometry solution owns some typical disadvantages such as the strong sensitivity to the table vibrations or temperature fluctuations, which hinders its usage outside the strictly controlled laboratory conditions. Phase retrieval presents a viable alternative to interferometry for measuring wavefront and can provide a more compact, less expensive, and more stable experimental setup. In this work, we propose a novel solution to freeform metrology based on phase retrieval and computer-generated hologram (CGH). The CGH is designed according to the ray tracing method, so as to compensate the aspheric aberration related to the freeform element. With careful alignment of the CGH and the freeform element in the testing system, several defocused intensity images can be captured for phase retrieval. In this paper the experimental results related to a freeform surface with 18×18mm2 rectangular aperture (its peak-to-valley aspherity equals to 193um) are reported, meanwhile, we also have compared them with the measurement results given by the interferometry solution, so as to evaluate the validity of our solution.

Paper Details

Date Published: 5 November 2014
PDF: 8 pages
Proc. SPIE 9272, Optical Design and Testing VI, 92720E (5 November 2014); doi: 10.1117/12.2073227
Show Author Affiliations
Fa Zeng, Tsinghua Univ. (China)
Qiaofeng Tan, Tsinghua Univ. (China)
Yi Liu, China Precision Engineering Institute (China)
Huarong Gu, Tsinghua Univ. (China)
Zhehai Zhou, Beijing Information Science and Technology Univ. (China)
Guofan Jin, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 9272:
Optical Design and Testing VI
Yongtian Wang; Chunlei Du; José Sasián; Kimio Tatsuno, Editor(s)

© SPIE. Terms of Use
Back to Top