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Proceedings Paper

Extraction of contour based on zero-crossing feature and contour measure
Author(s): Hanyu Hong; Jie Song; Li Zhang; Xiahua Zhang
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Paper Abstract

We present a method to extract edges using zero-crossing feature and contour measure. This method differs markedly from previous ones, since it provided a means of quantitative analysis to detect zero-crossing. There are two main steps in this method. Firstly, the edge intensity was obtained through the value of contour measure. Secondly, the actual edges are identified according to the edges intensity. A series of experiments are performed to test the algorithm proposed, which show that the edges is extracted more accurately and completely.

Paper Details

Date Published: 24 November 2014
PDF: 5 pages
Proc. SPIE 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition, 93013I (24 November 2014); doi: 10.1117/12.2073220
Show Author Affiliations
Hanyu Hong, Wuhan Institute of Technology (China)
Jie Song, Wuhan Institute of Technology (China)
Li Zhang, Wuhan Institute of Technology (China)
Xiahua Zhang, Wuhan Institute of Technology (China)


Published in SPIE Proceedings Vol. 9301:
International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
Gaurav Sharma; Fugen Zhou; Jennifer Liu, Editor(s)

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