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Proceedings Paper

Automatic one dimensional spectra extraction for Weihai fiber-fed high resolution echelle spectra
Author(s): Shao Ming Hu; Dong Yang Gao
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Paper Abstract

One fiber-fed high resolution echelle spectrograph was built for the one meter telescope atWeihai Observatory of Shandong University. It is used for exoplanet searching by radial velocity method and for stellar spectra analysis. One dimensional spectra extraction from the raw echelle data is researched in this paper. Flat field images with different exposure times were used to trace the order position accurately. The accurate background was fitted from each CCD image and it was subtracted from the raw image to correct the background and straylight. The intensity of each order decreases towards the order margin, and the lengths of order are different between the blue and red regions. The order tracing during the data reduction was investigated in this work. Accurate flux can be obtained after considering the effects of bad pixels, the curvature of each order and so on. One Interactive Data Language program for one dimensional spectra extraction was adopted and implemented to echelle data reduction for Weihai fiber-fed high resolution echelle spectra, and the results are illustrated here. The program is efficient and accurate for echelle data reduction. It can be adopted to reduce data taken by other instruments even the spectrographs in other fields, and it is very convenient for astronomers.

Paper Details

Date Published: 18 November 2014
PDF: 5 pages
Proc. SPIE 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics, 92980X (18 November 2014); doi: 10.1117/12.2073144
Show Author Affiliations
Shao Ming Hu, Shandong Univ. at Weihai (China)
Dong Yang Gao, Shandong Univ. at Weihai (China)


Published in SPIE Proceedings Vol. 9298:
International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics
Jannick P. Rolland; Changxiang Yan; Dae Wook Kim; Wenli Ma; Ligong Zheng, Editor(s)

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