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Proceedings Paper

A method of plane geometry primitive presentation
Author(s): Anbo Jiao; Haibo Luo; Zheng Chang; Bin Hui
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Paper Abstract

Point feature and line feature are basic elements in object feature sets, and they play an important role in object matching and recognition. On one hand, point feature is sensitive to noise; on the other hand, there are usually a huge number of point features in an image, which makes it complex for matching. Line feature includes straight line segment and curve. One difficulty in straight line segment matching is the uncertainty of endpoint location, the other is straight line segment fracture problem or short straight line segments joined to form long straight line segment. While for the curve, in addition to the above problems, there is another difficulty in how to quantitatively describe the shape difference between curves. Due to the problems of point feature and line feature, the robustness and accuracy of target description will be affected; in this case, a method of plane geometry primitive presentation is proposed to describe the significant structure of an object. Firstly, two types of primitives are constructed, they are intersecting line primitive and blob primitive. Secondly, a line segment detector (LSD) is applied to detect line segment, and then intersecting line primitive is extracted. Finally, robustness and accuracy of the plane geometry primitive presentation method is studied. This method has a good ability to obtain structural information of the object, even if there is rotation or scale change of the object in the image. Experimental results verify the robustness and accuracy of this method.

Paper Details

Date Published: 24 November 2014
PDF: 6 pages
Proc. SPIE 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition, 930131 (24 November 2014); doi: 10.1117/12.2073114
Show Author Affiliations
Anbo Jiao, Shenyang Institute of Automation (China)
Univ. of Chinese Academy of Sciences (China)
Haibo Luo, Shenyang Institute of Automation (China)
Zheng Chang, Shenyang Institute of Automation (China)
Bin Hui, Shenyang Institute of Automation (China)


Published in SPIE Proceedings Vol. 9301:
International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
Gaurav Sharma; Fugen Zhou; Jennifer Liu, Editor(s)

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