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Proceedings Paper

A precise laboratory goniometer system to collect spectral BRDF data of materials
Author(s): Guangping Jiao; Ziti Jiao; Jie Wang; Hu Zhang; Yadong Dong
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Paper Abstract

This paper presents a precise laboratory goniometer system to quickly collect bidirectional reflectance distribution factor(BRDF)of typical materials such soil, canopy and artificial materials in the laboratory. The system consists of the goniometer, SVC HR1024 spectroradiometer, and xenon long-arc lamp as light source. the innovation of cantilever slab can reduce the shadow of the goniometer in the principle plane. The geometric precision of the footprint centre is better than ±4cm in most azimuth directions, and the angle-controlling accuracy is better than 0.5°. The light source keeps good stability, with 0.8% irradiance decrease in 3 hours. But the large areal heterogeneity of the light source increase the data processing difficulty to capture the accurate BRDF. First measurements are taken from soil in a resolution of 15° and 30° in zenith and azimuth direction respectively, with the ±50° biggest view angle. More observations are taken in the hot-spot direction. The system takes about 40 minutes to complete all measurements. A spectralon panel is measured at the beginning and end of the whole period. A simple interactive interface on the computer can automatically control all operations of the goniometer and data-processing. The laboratory experiment of soil layer and grass lawn shows that the goniometer can capture the the multi-angle variation of BRDF.

Paper Details

Date Published: 18 November 2014
PDF: 4 pages
Proc. SPIE 9299, International Symposium on Optoelectronic Technology and Application 2014: Optical Remote Sensing Technology and Applications, 929915 (18 November 2014); doi: 10.1117/12.2073100
Show Author Affiliations
Guangping Jiao, Beijing Normal Univ. (China)
Ziti Jiao, Beijing Normal Univ. (China)
Jie Wang, Beijing Forestry Univ. (China)
Hu Zhang, Beijing Normal Univ. (China)
Yadong Dong, Beijing Normal Univ. (China)


Published in SPIE Proceedings Vol. 9299:
International Symposium on Optoelectronic Technology and Application 2014: Optical Remote Sensing Technology and Applications
Anatoli G. Borovoi; Dong Liu, Editor(s)

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