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Proceedings Paper

Modeling and validation of spectral BRDF on material surface of space target
Author(s): Qingyu Hou; Xiyang Zhi; Huili Zhang; Wei Zhang
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Paper Abstract

The modeling and the validation methods of the spectral BRDF on the material surface of space target were presented. First, the microscopic characteristics of the space targets’ material surface were analyzed based on fiber-optic spectrometer using to measure the direction reflectivity of the typical materials surface. To determine the material surface of space target is isotropic, atomic force microscopy was used to measure the material surface structure of space target and obtain Gaussian distribution model of microscopic surface element height. Then, the spectral BRDF model based on that the characteristics of the material surface were isotropic and the surface micro-facet with the Gaussian distribution which we obtained was constructed. The model characterizes smooth and rough surface well for describing the material surface of the space target appropriately. Finally, a spectral BRDF measurement platform in a laboratory was set up, which contains tungsten halogen lamp lighting system, fiber optic spectrometer detection system and measuring mechanical systems with controlling the entire experimental measurement and collecting measurement data by computers automatically. Yellow thermal control material and solar cell were measured with the spectral BRDF, which showed the relationship between the reflection angle and BRDF values at three wavelengths in 380nm, 550nm, 780nm, and the difference between theoretical model values and the measured data was evaluated by relative RMS error. Data analysis shows that the relative RMS error is less than 6%, which verified the correctness of the spectral BRDF model.

Paper Details

Date Published: 18 November 2014
PDF: 10 pages
Proc. SPIE 9299, International Symposium on Optoelectronic Technology and Application 2014: Optical Remote Sensing Technology and Applications, 929914 (18 November 2014); doi: 10.1117/12.2073058
Show Author Affiliations
Qingyu Hou, Harbin Institute of Technology (China)
Xiyang Zhi, Harbin Institute of Technology (China)
Huili Zhang, Harbin Institute of Technology (China)
Wei Zhang, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 9299:
International Symposium on Optoelectronic Technology and Application 2014: Optical Remote Sensing Technology and Applications
Anatoli G. Borovoi; Dong Liu, Editor(s)

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