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Proceedings Paper

The research of 3D small-field imaging system based on fringe projection technique
Author(s): Yanqin Yu; Shujun Huang; Zonghua Zhang; Feng Gao; Xiangqian Jiang
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Paper Abstract

This paper presents a 3D small-field imaging system by using the color fringe projection technique to measure the small objects having large slopes and/or discontinuous surface. A stereo microscope is used to generate a small-field projecting field and to capture the deformed fringe patterns on the measured small objects, respectively. Three fringe sets having the optimum fringe numbers are coded into one major color channel to generate color fringe patterns having the maximum fringe contrast of the captured fringe images. Through one channel of the stereo microscope, a DLP (Digital Light Processing) projector projects these generated color fringe pattern images onto the measured objects surface. From another channel, the fringe patterns are deformed with regard to the object surface and captured by a color CCD camera. The absolute phase of each pixel can be calculated from the captured fringe patterns by using the optimum three-fringe numbers selection method. Experimental results on measuring 3D shape of small objects show the accuracy and availability of the developed 3D imaging system.

Paper Details

Date Published: 3 December 2014
PDF: 8 pages
Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92972D (3 December 2014); doi: 10.1117/12.2073051
Show Author Affiliations
Yanqin Yu, Hebei Univ. of Technology (China)
Shujun Huang, Hebei Univ. of Technology (China)
Zonghua Zhang, Hebei Univ. of Technology (China)
Feng Gao, Univ. of Huddersfield (United Kingdom)
Xiangqian Jiang, Univ. of Huddersfield (United Kingdom)


Published in SPIE Proceedings Vol. 9297:
International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors
Jurgen Czarske; Shulian Zhang; David Sampson; Wei Wang; Yanbiao Liao, Editor(s)

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