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Proceedings Paper

Sensitivity-enhanced top-hat Z-scan by absorbing part of the incident light
Author(s): Wei Wang; Jun-yi Yang; Yu Fang; Ying-lin Song
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Paper Abstract

In this paper, we present a new technology to enhance the sensitivity by absorbing part of the light at the entry of the Z-scan system. Compared to the top-hat Z-scan, the curves of the modified top-hat Z-scan for the nonlinear refraction show higher peak-to-valley values, which mean higher sensitivity with our modified method. Nonlinear refraction of CS2 is investigated using this technique with 19ps pulses at wavelength of 532 nm.

Paper Details

Date Published: 3 December 2014
PDF: 6 pages
Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92971P (3 December 2014); doi: 10.1117/12.2073040
Show Author Affiliations
Wei Wang, Soochow Univ. (China)
Jun-yi Yang, Soochow Univ. (China)
Yu Fang, Soochow Univ. (China)
Ying-lin Song, Soochow Univ. (China)
Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 9297:
International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors
Jurgen Czarske; Shulian Zhang; David Sampson; Wei Wang; Yanbiao Liao, Editor(s)

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