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Proceedings Paper

A new infrared sensor model based on imaging system parameters
Author(s): Zheng Liu; Hongxia Mao; Yinghong Dai; Jingli Wu
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Paper Abstract

When infrared detection scene simulation, Target signature quantitative measurement, a high confidence sensor model should be developed. Generally, sensor model is developed by dividing an infrared sensor into three parts: optics, detector and electronic circuits. Then several Mathematics models describing those parts effect are developed, and a sensor model is integrated. In this way, the sensor model is based on strict mathematic theory. But this model needs a lot of parameters, some of which are very difficult to achieve. So this model have an advantage to analyze sensor model effect, and when to simulating Infrared detection scene or to analyzing quantitative measurement precision of faint target by actual infrared sensor, a sensor model which is based on parameters that can be achieved should be developed. This article presents a new sensor model. The input parameters includes: SiTF, MTF, Noise and so on, all of which can be achieved in laboratory or outfield. The sensor model is validated by point target experiment and four-bar target experiment, and the error is within 5%. The SiTF parameter can be achieved through the relation of blackbody radiation and sensor signal. The noise parameter can be achieved by nonuniform background sensor signal and SiTF. The MTF parameter is very important, but it is difficult to be measured directly, especially outfield. This article presents a method to inverse the MTF by point target observation experiment. This method can be used to inverse an actual sensor MTF outfield by star observation experiment.

Paper Details

Date Published: 20 November 2014
PDF: 6 pages
Proc. SPIE 9300, International Symposium on Optoelectronic Technology and Application 2014: Infrared Technology and Applications, 930022 (20 November 2014); doi: 10.1117/12.2072901
Show Author Affiliations
Zheng Liu, Science and Technology on Optical Radiation Lab. (China)
Hongxia Mao, Science and Technology on Optical Radiation Lab. (China)
Yinghong Dai, Science and Technology on Optical Radiation Lab. (China)
Jingli Wu, Science and Technology on Optical Radiation Lab. (China)


Published in SPIE Proceedings Vol. 9300:
International Symposium on Optoelectronic Technology and Application 2014: Infrared Technology and Applications
Mircea Guina; Haimei Gong; Zhichuan Niu; Jin Lu, Editor(s)

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