Share Email Print

Proceedings Paper

Identification method of satellite local components based on combined feature metrics
Author(s): Xi-yang Zhi; Qing-yu Hou; Wei Zhang; Xuan Sun; Dawei Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In order to meet the requirements of identification of satellite local targets, a new method based on combined feature metrics is proposed. Firstly, the geometric features of satellite local targets including body, solar panel and antenna are analyzed respectively, and then the cluster of each component are constructed based on the combined feature metrics of mathematical morphology. Then the corresponding fractal clustering criterions are given. A cluster model is established, which determines the component classification according to weighted combination of the fractal geometric features. On this basis, the identified targets in the satellite image can be recognized by computing the matching probabilities between the identified targets and the clustered ones, which are weighted combinations of the component fractal feature metrics defined in the model. Moreover, the weights are iteratively selected through particle swarm optimization to promote recognition accuracy. Finally, the performance of the identification algorithm is analyzed and verified. Experimental results indicate that the algorithm is able to identify the satellite body, solar panel and antenna accurately with identification probability up to 95%, and has high computing efficiency. The proposed method can be applied to identify on-orbit satellite local targets and possesses potential application prospects on spatial target detection and identification.

Paper Details

Date Published: 24 November 2014
PDF: 9 pages
Proc. SPIE 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition, 93012J (24 November 2014); doi: 10.1117/12.2072693
Show Author Affiliations
Xi-yang Zhi, Harbin Institute of Technology (China)
Qing-yu Hou, Harbin Institute of Technology (China)
Wei Zhang, Harbin Institute of Technology (China)
Xuan Sun, Harbin Institute of Technology (China)
Dawei Wang, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 9301:
International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
Gaurav Sharma; Fugen Zhou; Jennifer Liu, Editor(s)

© SPIE. Terms of Use
Back to Top