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Proceedings Paper

The multi-spectral radiation influence research between buildings
Author(s): Bo Li; Huai-ci Zhao; Shi-jie Sun
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Paper Abstract

In order to improve the accuracy of multi-spectral scene simulation, and avoid resource waste of unnecessary computing, some researches on the radiation influence between buildings during the multi-spectral simulation in the waveband 3-5μm and 8-12μm have been done, so as to provide theoretical support for whether it is needed to compute the radiation influence between buildings in the multi-spectral simulation. This paper determines the primary factors that affect the degree of radiation influence between buildings, determines the effect that the sun direct radiation to the radiation influence between buildings, derives the computation formula for radiation influence between buildings in a specific scene from many basic common heat radiation formula and simulates the scene radiation in multi-spectral in the specific scene. Finally, the importance of radiation influence between buildings comparing to the entire scene simulation radiation was evaluated based on numerical calculation. The numerical calculation results show that the radiation influence between buildings in waveband 3-5μm can be ignored when the sun direct radiation exists, which can’t be ignored in waveband 8-12μm. In the waveband 8-12μm, the radiation influence between nearby buildings is great in waveband 8μm, 9μm and 10μm, more than 10% comparing to the buildings’ self radiation, which is small in waveband 11μm and 12μm, less than 4%.

Paper Details

Date Published: 24 November 2014
PDF: 6 pages
Proc. SPIE 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition, 93011Y (24 November 2014); doi: 10.1117/12.2072404
Show Author Affiliations
Bo Li, Shenyang Institute of Automation (China)
Shenyang Institute of Engineering (China)
Univ. of Chinese Academy of Sciences (China)
Huai-ci Zhao, Shenyang Institute of Automation (China)
Key Lab. of Opto-Electronic Information Processing (China)
Key Lab. of Image Understanding and Computer Vision (China)
Shi-jie Sun, Shenyang Institute of Automation (China)
Univ. of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 9301:
International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
Gaurav Sharma; Fugen Zhou; Jennifer Liu, Editor(s)

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