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Proceedings Paper

Fiber inline Mach-Zehnder interferometer fabricated by fusion splicing for high temperature sensing
Author(s): Benye Li; Shufeng Ni; Zhitao Cao; Sumei Wang
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Paper Abstract

High temperature detection of micro structure area with high sensitivity has aroused more and more interest recently. A high temperature sensor based on ultra-abrupt tapered fiber Mach-Zehnder interferometer (MZI) is proposed and fabricated by using a fusion-splicing method.The two normal cleaved ends are separated by a distance and become ellipsoidal by one time discharge using a fiber fusion splicer. Then the two ellipsoidal fiber heads contacted between the splicer electrodes are fused together to form the taper. And the other is formed through the same process separated by a distance of L. The thermal characteristic is investigated in 25–1100 °C, which temperature limit is highest of tapered fiber MZIs. It is observed that sensitivity varies with temperature ranges, which are 25 pm/°C in low-temperature range(25-300°C) and 105 pm/°C in high-temperature range(300-1100°C) respectively. The sensor demonstrates good thermal stability after annealing at 400 °C and 800 °C for 8 h respectively. The simple ultra-taper based MZI sensor has potential application prospect in the field of high temperature detection, such as the temperature of aeroengine.

Paper Details

Date Published: 3 December 2014
PDF: 7 pages
Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92972V (3 December 2014); doi: 10.1117/12.2071916
Show Author Affiliations
Benye Li, Beijing Institute of Specialized Machinery (China)
Shufeng Ni, Beijing Institute of Specialized Machinery (China)
Zhitao Cao, Beijing Institute of Technology (China)
Sumei Wang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 9297:
International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors
Jurgen Czarske; Shulian Zhang; David Sampson; Wei Wang; Yanbiao Liao, Editor(s)

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