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Proceedings Paper

Light scattering characterization of optical components: BRDF, BTDF, and scatter losses
Author(s): Sven Schröder; Alexander Finck; Dina Katsir; Uwe Zeitner; Angela Duparré
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Paper Abstract

Light scattering caused by imperfections of optical components can critically affect the performance of optical systems in terms of losses and image degradation. Because of the numerous potential sources of scattering such as roughness, surface and sub-surface defects, bulk inhomogeneities, as well as coatings, scattering properties must be carefully specified and measured at the wavelengths of application. Bidirectional Reflectance and Transmittance Distribution Functions (BRDF / BTDF) are used to quantify the angle resolved scattering properties. The data can be used as an input for optical engineering software just as FRED, ASAP, ZEMAX for stray light modeling. In addition, analyzing the scattered light can provide valuable information about the relevant imperfections. The presentation provides an overview of instrumentation for light scattering measurements at wavelengths ranging from the visible to the extreme ultraviolet and the infrared spectral regions. Examples of applications will be discussed ranging from superpolished mirrors to diffraction gratings, interference coatings, and black absorbing coatings.

Paper Details

Date Published: 5 November 2014
PDF: 5 pages
Proc. SPIE 9272, Optical Design and Testing VI, 927202 (5 November 2014); doi: 10.1117/12.2071908
Show Author Affiliations
Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Alexander Finck, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Dina Katsir, Acktar Ltd. (Israel)
Uwe Zeitner, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Angela Duparré, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

Published in SPIE Proceedings Vol. 9272:
Optical Design and Testing VI
Yongtian Wang; Chunlei Du; José Sasián; Kimio Tatsuno, Editor(s)

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