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Proceedings Paper

Optimized dithering technique for 3D shape measurement based on intensity residual error
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Paper Abstract

It is obvious that those recently developed dithering techniques could improve measurement quality. However, those optimization methods are still imperfect since they are sensitive to the amount of defocusing. This paper presents a new optimization method based on minimizing a proposed objective function named intensity residual error (IRE) to construct binary patterns for high-quality 3D shape measurement. Both the simulation and experimental results demonstrate that the proposed algorithm can achieve phase quality improvements over other developed dithering techniques with various amounts of defocusing especially when the fringe period is larger.

Paper Details

Date Published: 3 December 2014
PDF: 5 pages
Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92970Z (3 December 2014); doi: 10.1117/12.2071895
Show Author Affiliations
Jiasong Sun, Nanjing Univ. of Science and Technology (China)
Yuzhen Zhang, Nanjing Univ. of Science and Technology (China)
Chao Zuo, Nanjing Univ. of Science and Technology (China)
Shijie Feng, Nanjing Univ. of Science and Technology (China)
ShiLing Yu, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9297:
International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors
Jurgen Czarske; Shulian Zhang; David Sampson; Wei Wang; Yanbiao Liao, Editor(s)

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