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Proceedings Paper

A model of PSF estimation for coded mask infrared imaging
Author(s): Ao Zhang; Jie Jin; Qing Wang; Jingyu Yang; Yi Sun
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Paper Abstract

The point spread function (PSF) of imaging system with coded mask is generally acquired by practical measure- ment with calibration light source. As the thermal radiation of coded masks are relatively severe than it is in visible imaging systems, which buries the modulation effects of the mask pattern, it is difficult to estimate and evaluate the performance of mask pattern from measured results. To tackle this problem, a model for infrared imaging systems with masks is presented in this paper. The model is composed with two functional components, the coded mask imaging with ideal focused lenses and the imperfection imaging with practical lenses. Ignoring the thermal radiation, the systems PSF can then be represented by a convolution of the diffraction pattern of mask with the PSF of practical lenses. To evaluate performances of different mask patterns, a set of criterion are designed according to different imaging and recovery methods. Furthermore, imaging results with inclined plane waves are analyzed to achieve the variation of PSF within the view field. The influence of mask cell size is also analyzed to control the diffraction pattern. Numerical results show that mask pattern for direct imaging systems should have more random structures, while more periodic structures are needed in system with image reconstruction. By adjusting the combination of random and periodic arrangement, desired diffraction pattern can be achieved.

Paper Details

Date Published: 4 November 2014
PDF: 11 pages
Proc. SPIE 9273, Optoelectronic Imaging and Multimedia Technology III, 92730C (4 November 2014); doi: 10.1117/12.2071874
Show Author Affiliations
Ao Zhang, Tianjin Univ. (China)
Jiuquan Satellite Launch Ctr. (China)
Jie Jin, Tianjin Univ. (China)
Qing Wang, Tianjin Univ. (China)
Jingyu Yang, Tianjin Univ. (China)
Yi Sun, Tianjin Jinhang Institute of Technology Physics (China)


Published in SPIE Proceedings Vol. 9273:
Optoelectronic Imaging and Multimedia Technology III
Qionghai Dai; Tsutomu Shimura, Editor(s)

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