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Proceedings Paper

A new compact spectrometer on atmospheric sounding and environmental exploration
Author(s): Huan Li; Feng Zhou; Zheng Wang; Jia Zhao; Jian Wang
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Paper Abstract

Climate warming has become a serious problem facing all countries in the world, the impact of global climate change on the human environment subject to widespread international concern. In recent years, American and European countries invest a lot of manpower and resources to carry out the detection load of Atmospheric and Environmental Research, and the ultra-high spectral resolution capability is an important prerequisite for the realization of atmospheric trace constituents exact retrieved, the development of ultra-high spectral resolution load has become an important trend. This paper presents a new compact spectrometer for atmospheric and environmental exploration, which uses a narrow-band interference filter type, filter through different angles of incidence of the light beam spectral drift characteristics , to achieve ultra- fine spectral splitting . This spectrometer while achieving ultra-high spectral resolution , the structure of a compact camera with good engineering can be realized , and has broad application prospects.

Paper Details

Date Published: 18 November 2014
PDF: 6 pages
Proc. SPIE 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics, 92980K (18 November 2014); doi: 10.1117/12.2071852
Show Author Affiliations
Huan Li, Beijing Institute of Space Mechanics and Electricity (China)
Feng Zhou, Beijing Institute of Space Mechanics and Electricity (China)
Zheng Wang, Beijing Institute of Space Mechanics and Electricity (China)
Jia Zhao, Beijing Institute of Space Mechanics and Electricity (China)
Jian Wang, Beijing Institute of Space Mechanics and Electricity (China)


Published in SPIE Proceedings Vol. 9298:
International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics
Jannick P. Rolland; Changxiang Yan; Dae Wook Kim; Wenli Ma; Ligong Zheng, Editor(s)

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