Share Email Print
cover

Proceedings Paper

The assessment of industrial CT's probing error
Author(s): Yushu Shi; Sitian Gao; Xu Song; Dongsheng Li; Wei Li; Qi Li; Shi Li; Siwen Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Similar to traditional CMM, probing error of industrial CT is used for assessing the 3D measurement error of the machine in a very small measurement volume. A research on the assessment of probing error of industrial CT is conducted here. Lots of assessment tests are carried out on the industrial CT Metrotom1500 in the National institute of metrology, using standard balls with different size and materials. The test results demonstrate that probing error of industrial CT can be affected seriously by the measurement strategy and standard balls. According to some further analysis about the test results, the assessment strategy of industrial CT’s probing error is concluded preliminary, which can ensure the comparability of the assessment results in different industrial CT system.

Paper Details

Date Published: 13 November 2014
PDF: 10 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92760T (13 November 2014); doi: 10.1117/12.2071795
Show Author Affiliations
Yushu Shi, Tianjin Univ. (China)
National Institute of Metrology (China)
Sitian Gao, National Institute of Metrology (China)
Xu Song, China Jiliang Univ. (China)
Dongsheng Li, China Jiliang Univ. (China)
Wei Li, National Institute of Metrology (China)
Qi Li, National Institute of Metrology (China)
Shi Li, National Institute of Metrology (China)
Siwen Chen, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top