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Proceedings Paper

Optimal design of optical length in low turbidity measurement system with wavelength 1310 nm and 1550 nm
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Paper Abstract

To meet the need of long distance transmission in low turbidity measurement system for low-loss, a new optical structure with wavelength 1310nm and 1550nm as the incident light is employed. In this research, experiments have been done for different optical length of the two wavelength light sources. The results show that: first, the transmitted light intensity has big difference under the circumstance of same concentration and optical length, though the loss has no remarkable difference transmitted in optical fiber between 1310nm and 1550nm. Second, the optimized optical length for better absorbance has been determined for 1310nm and 1550nm and it is irrelevant to the incident intensity. Third, the intensity of the two transmitted light decreases exponentially with the increase of optical length. For example, when the range of the optical length of 1310nm is 0.5mm-2mm, the transmitted intensity is about 60%-79% and the absorbance is 0.12-0.42. The transmitted intensity is about 5%-44%. When the range of the optical length of 1550nm is 0.5mm-2mm and the absorbance is still 0.12-0.42. Our experimental data provides the basis both for the optical length selection of these two light sources in water and the near-infrared spectral wavelength selection.

Paper Details

Date Published: 13 November 2014
PDF: 7 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92761P (13 November 2014); doi: 10.1117/12.2071612
Show Author Affiliations
Hui-bin Cao, Anhui Institute of Optics and Fine Mechanics (China)
Jian-guo Liu, Anhui Institute of Optics and Fine Mechanics (China)
Hua-qiao Gui, Anhui Institute of Optics and Fine Mechanics (China)
Jie Wang, Anhui Institute of Optics and Fine Mechanics (China)
Huan-qin Wang, Institute of Intelligent Machines (China)


Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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