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Proceedings Paper

An integral imaging method for depth extraction with lens array in an optical tweezer system
Author(s): Shulu Wang; Wei-Wei Liu; Anting Wang; Yinmei Li; Hai Ming
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Paper Abstract

In this paper, a new integral imaging method is proposed for depth extraction in an optical tweezer system. A mutual coherence algorithm of stereo matching are theoretically analyzed and demonstrated feasible by virtual simulation. In our design, optical tweezer technique is combined with integral imaging in a single microscopy system by inserting a lens array into the optical train. On one hand, the optical tweezer subsystem is built based on the modulated light field from a solid laser, and the strong focused beam forms a light trap to capture tiny specimens. On the other hand, through parameters optimization, the microscopic integral imaging subsystem is composed of a microscope objective, a lens array (150x150 array with 0.192mm unit size and 9mm focal length) and a single lens reflex (SLR). Pre-magnified by the microscope objective, the specimens formed multiple images through the lens array. A single photograph of a series of multiple sub-images has recorded perspective views of the specimens. The differences between adjacent sub-images have been analyzed for depth extraction with the mutual coherence algorithm. The experimental results show that the axial resolution can reach to 1μm -1 and lateral resolution can reach to 2 μm -1.

Paper Details

Date Published: 24 October 2014
PDF: 7 pages
Proc. SPIE 9270, Optoelectronic Devices and Integration V, 92700O (24 October 2014); doi: 10.1117/12.2071566
Show Author Affiliations
Shulu Wang, Univ. of Science and Technology of China (China)
Wei-Wei Liu, Univ. of Science and Technology of China (China)
Anting Wang, Univ. of Science and Technology of China (China)
Yinmei Li, Univ. of Science and Technology of China (China)
Hai Ming, Univ. of Science and Technology of China (China)

Published in SPIE Proceedings Vol. 9270:
Optoelectronic Devices and Integration V
Xuping Zhang; Hai Ming; Changyuan Yu, Editor(s)

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