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Proceedings Paper

Scanning freeform objects by combining shape from silhouette and shape from line structured light
Author(s): Hanwei Xiong; Jun Xu; Chenxi Xu; Ming Pan
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Paper Abstract

Freeform shape is usually designed by reverse engineering method thorough a 3D scanner, which is often expensive to most persons. The paper proposes a new scanning system combining shape from structured light and shape from silhouette, which can be implemented easily with low cost. The two methods are very complementary. For shape from silhouette, it can capture correct topological information of the object and obtain a closed envelop, and for shape from hand-held laser line, precise point clouds with some holes can be obtained. To gain their complementary advantages, a new data fusion strategy based a mesh energy functional is proposed to integrate the information from the two scanning methods, in which the points resulted from laser light will attract closed envelop from silhouette. After fusion, the precision of shape from silhouette is increased, and the topological error of shape from structured light is corrected. The design details are introduced, and a toy model is used to test the new method, which is difficult to scan using other systems. The test results proof the validity of the new method.

Paper Details

Date Published: 3 December 2014
PDF: 5 pages
Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92972F (3 December 2014); doi: 10.1117/12.2071553
Show Author Affiliations
Hanwei Xiong, Guangdong Univ. of Technology (China)
Jun Xu, Guangdong Univ. of Technology (China)
Chenxi Xu, Guangdong Univ. of Technology (China)
Ming Pan, Guangdong Univ. of Technology (China)


Published in SPIE Proceedings Vol. 9297:
International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors
Jurgen Czarske; Shulian Zhang; David Sampson; Wei Wang; Yanbiao Liao, Editor(s)

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