Share Email Print
cover

Proceedings Paper

The error analyze of testing the large aperture flat by the Ritchey-Common method
Author(s): Bo Ji; Chen Xu; Bo Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

When polishing and modifying the large aperture flat by the traditional polishing tools, people usually test it by a spherical mirror as a standard surface which been called the Ritchey-Common method, that not only can break through the limitation of the aperture, but also can achieve high precision wave front if the surface of the standard mirror is perfect. However, when doing ultrahigh precision modifying by the modern polishing equipment such as: ion beam polishing, this testing method cannot meet the need of the high precision location, because of the error caused by the nonlinear transformation of the coordinate, the testing result usually cannot been very exactly developed point to point, that restrained the polishing accuracy. Here the error has been studied in order to exactly developing the testing result. At first, in principle, the Ritchey- Common testing path has been analyzed in detail. Secondly, the point to point transfer equation has been deduced, and some feature points have been chosen to help analyze the relationship between the object surface and the image result. Then a program has been written according to the deduced equation, by which the image can be well developed. Finally the error has been compared by using different developing methods in the experiment. The study can solve the nonlinear point to point transfer and location problem caused by the Ritchey-Common testing method, so when manufacturing the large aperture flat, the Ritchey-Common testing method can be used in the ultrahigh precision polishing.

Paper Details

Date Published: 18 November 2014
PDF: 6 pages
Proc. SPIE 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics, 92981A (18 November 2014); doi: 10.1117/12.2071403
Show Author Affiliations
Bo Ji, Nanjing Institute of Astronomical Optics & Technology (China)
Chen Xu, Nanjing Institute of Astronomical Optics & Technology (China)
Bo Li, Nanjing Institute of Astronomical Optics & Technology (China)


Published in SPIE Proceedings Vol. 9298:
International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics
Jannick P. Rolland; Changxiang Yan; Dae Wook Kim; Wenli Ma; Ligong Zheng, Editor(s)

© SPIE. Terms of Use
Back to Top