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Proceedings Paper

A hand-held, high-resolution 3D shape measurement system using structured and unstructured illumination
Author(s): Kai Zhong; Zhongwei Li; Xiaohui Zhou; Yusheng Shi; Congjun Wang
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Paper Abstract

This paper presents a high-resolution 3D shape acquisition method for developing hand-held 3D measurement system by projecting structured and unstructured patterns. The structured patterns consist of three-step phase-shifting fringe patterns, and the phase can be computed pixel by pixel to achieve high-resolution 3D measurement, and the phaseshifting method commonly requires many additional images to implement a phase unwrapping procedure for obtaining absolute phase value and removing the correspondence ambiguity, but it would slow down the measurement speed and limits its applications in fast 3D measurement. To address this problem, an unstructured pattern using random speckle is employed to reject wrong correspondence and promises a correct 3D result. Therefore, only four images are required to reconstruct one 3D point cloud, which is suitable for fast 3D measurement in hand-held systems. Moreover, the proposed method can be speed up by parallel computing technology for real-time data processing. The experiments verify the performance of the proposed method.

Paper Details

Date Published: 13 November 2014
PDF: 9 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92760D (13 November 2014); doi: 10.1117/12.2071337
Show Author Affiliations
Kai Zhong, Huazhong Univ. of Science and Technology (China)
Zhongwei Li, Huazhong Univ. of Science and Technology (China)
Xiaohui Zhou, Wuhan Univ. (China)
Yusheng Shi, Huazhong Univ. of Science and Technology (China)
Congjun Wang, Huazhong Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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