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Proceedings Paper

Measurement of crystal defects using phase retrieval technique
Author(s): Yudong Yao; Junyong Zhang; Yanli Zhang; Jianqiang Zhu
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Paper Abstract

In high power laser systems, crystal defects introduced by manufacturing have significant impact on quality of light beams; finally affect the output status of high power laser system. The phase retrieval algorithm can precisely measure the crystal defects, such as the residual periodic perturbations in a relatively large area and the relatively small point defects, with the resolution of micrometer magnitude. At the same time, the multiple near-focus intensity measurements algorithm used here can retrieve the morphology of focal spot, which is modulated by the defects and cannot be directly measured due to its high power. In addition, the algorithm has been improved in order to use less measurement planes and less iteration times to complete retrieval.

Paper Details

Date Published: 3 February 2015
PDF: 7 pages
Proc. SPIE 9255, XX International Symposium on High-Power Laser Systems and Applications 2014, 92554M (3 February 2015); doi: 10.1117/12.2071246
Show Author Affiliations
Yudong Yao, Shanghai Insititute of Optics and Fine Mechanics (China)
Junyong Zhang, Shanghai Insititute of Optics and Fine Mechanics (China)
Yanli Zhang, Shanghai Insititute of Optics and Fine Mechanics (China)
Jianqiang Zhu, Shanghai Insititute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 9255:
XX International Symposium on High-Power Laser Systems and Applications 2014
Chun Tang; Shu Chen; Xiaolin Tang, Editor(s)

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