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Proceedings Paper

The application of ptychography in the field of high power laser
Author(s): Haiyan Wang; Cheng Liu; Xingchen Pan; Jianqiang Zhu
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Paper Abstract

The commonly used interferometer and Hartmann-Shack sensor are not ideally qualified for the phase or wavefront measurement in the field of high power laser because the optical elements always have large aperture, the steep phase gradient and very irregular surface profile. The ptychography, which is a newly developed coherent diffraction method for the imaging with short wavelength, can be a perfect alternative to traditional technologies due to its outstanding advantages. The complex transmittance of the optical element can be obtained by measuring its transmitted and incident fields with ptychography and calculating their phase difference. Since ptychography can realize measurement with a resolution comparable to that of interferometry, it can find lots of applications in the field of high power laser such as the measurement of the complex transmittance of large optical element, the thermal distortion of the gas-cooled Nd:glass amplifier, and the focal length of the lens array etc.

Paper Details

Date Published: 3 February 2015
PDF: 7 pages
Proc. SPIE 9255, XX International Symposium on High-Power Laser Systems and Applications 2014, 925534 (3 February 2015); doi: 10.1117/12.2071096
Show Author Affiliations
Haiyan Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Cheng Liu, Shanghai Institute of Optics and Fine Mechanics (China)
Xingchen Pan, Shanghai Institute of Optics and Fine Mechanics (China)
Jianqiang Zhu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 9255:
XX International Symposium on High-Power Laser Systems and Applications 2014
Chun Tang; Shu Chen; Xiaolin Tang, Editor(s)

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