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Proceedings Paper

Fiber optical accelerometer based on 45 degrees Fabry-Perot cavity
Author(s): Jing Han; Wentao Zhang; Zhaogang Wang; Baochen Sun; Binhong Xu; Fang Li
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Paper Abstract

The paper proposes an accelerometer construction based on 45-degrees Fabry-Perot (F-P) interferometer cavity. The uniform intensity cantilever consists of a mass block in the middle and a 45-degrees F-P cavity fixed inside the mass. The mass block can oscillate freely when the vibrating sensor is subject to the vibration and the F-P cavity length is changing. The G-lens end face and total reflective film make up the two reflective films of the F-P cavity, and the reflectivity are 4% and 90% respectively. In the F-P cavity, a 45-degrees mirror fixed in the middle of the G-lens and total reflective film. The mirror can change the transmission of the light and increase the optical path difference. The total reflective film fixed in the steel tube and the G-lens fixed in the fine tuning bolt. The bolt can fine adjust the F-P cavity in sensor encapsulating. The sensor structure lead to the optical loss in the airborne and tilted mirror, besides the distance of F-P gap in steel tube and the optical coupling efficiency can’t work out accurately, so we did a series deterministic test before encapsulating, for example the selection of the structures, the diameter of the optical fibers and the diameter of the reflective films. At last, 9/125 μm optical fiber, 1.4 mm total reflective film and the structure of total reflective film out of steel tube were used for the accelerometer. The sensitivity can reach 0.042 rad/g and the resonant frequency of the accelerometer is 400 Hz.

Paper Details

Date Published: 17 November 2014
PDF: 6 pages
Proc. SPIE 9274, Advanced Sensor Systems and Applications VI, 927418 (17 November 2014); doi: 10.1117/12.2071090
Show Author Affiliations
Jing Han, Shijiazhuang Tiedao Univ. (China)
Institute of Semiconductors (China)
Wentao Zhang, Institute of Semiconductors (China)
Zhaogang Wang, Institute of Semiconductors (China)
Baochen Sun, Shijiazhuang Tiedao Univ. (China)
Binhong Xu, Shijiazhuang Tiedao Univ. (China)
Institute of Semiconductors (China)
Fang Li, Institute of Semiconductors (China)


Published in SPIE Proceedings Vol. 9274:
Advanced Sensor Systems and Applications VI
Tiegen Liu; Shibin Jiang; Niels Neumann, Editor(s)

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