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Proceedings Paper

Optical coherence tomography imaging of microfluidic pattern with different refractive index contrast
Author(s): Zhixiong Hu; Bingtao Hao; Wenli Liu; Baoyu Hong
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Paper Abstract

Optical coherence tomography (OCT) technology is analogous to ultrasound imaging, except that OCT employs light instead of sound. The non-invasive imaging method works by projecting light on test target and detecting the backscattering from the underlying layers. As the OCT technology is based on optical interference, the internal structural features and inhomogeneities induced by different refractive index contrast could be detected and displayed in the form of a gray scale or false color image. In this paper, a typical microfluidic device was produced and measured by a spectral domain OCT instrument. The internal dimensions of the lab-on-chip device were determined using the OCT imaging technology and were in agreement with results obtained with conventional confocal microscope. In order to study the effect of different refractive index contrast on OCT imaging, fluid with various refractive indexes was injected into the microfluidic channel respectively, and the acquired OCT images of the internal microfluidic channel were compared. The results demonstrate that optical coherence tomography could be used as a new metrology tool to determine the internal channel dimensions of lab-on-chip devices. Furthermore, the experiment results reveal the relations between the refractive index contrast and OCT image quality.

Paper Details

Date Published: 18 November 2014
PDF: 6 pages
Proc. SPIE 9268, Optics in Health Care and Biomedical Optics VI, 926816 (18 November 2014); doi: 10.1117/12.2070982
Show Author Affiliations
Zhixiong Hu, National Institute of Metrology (China)
Bingtao Hao, National Institute of Metrology (China)
Wenli Liu, National Institute of Metrology (China)
Baoyu Hong, National Institute of Metrology (China)

Published in SPIE Proceedings Vol. 9268:
Optics in Health Care and Biomedical Optics VI
Qingming Luo; Xingde Li; Ying Gu; Yuguo Tang, Editor(s)

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