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Proceedings Paper

A new technique of recognition for coded targets in optical 3D measurement
Author(s): Changye Guo; Xiaosheng Cheng; Haihua Cui; Ning Dai; Jinping Weng
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Paper Abstract

A new technique for coded targets recognition in optical 3D-measurement application is proposed in this paper. Traditionally, point cloud registration is based on homologous features, such as the curvature, which is time-consuming and not reliable. For this, we paste some coded targets onto the surface of the object to be measured to improve the optimum target location and accurate correspondence among multi-source images. Circular coded targets are used, and an algorithm to automatically detecting them is proposed. This algorithm extracts targets with intensive bimodal histogram features from complex background, and filters noise according to their size, shape and intensity. In addition, the coded targets’ identification is conducted out by their ring codes. We affine them around the circle inversely, set foreground and background respectively as 1 and 0 to constitute a binary number, and finally shift one bit every time to calculate a decimal one of the binary number to determine a minimum decimal number as its code. In this 3Dmeasurement application, we build a mutual relationship between different viewpoints containing three or more coded targets with different codes. Experiments show that it is of efficiency to obtain global surface data of an object to be measured and is robust to the projection angles and noise.

Paper Details

Date Published: 13 November 2014
PDF: 7 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92761H (13 November 2014); doi: 10.1117/12.2070957
Show Author Affiliations
Changye Guo, Nanjing Univ. of Aeronautics and Astronautics (China)
Xiaosheng Cheng, Nanjing Univ. of Aeronautics and Astronautics (China)
Haihua Cui, Nanjing Univ. of Aeronautics and Astronautics (China)
Ning Dai, Nanjing Univ. of Aeronautics and Astronautics (China)
Jinping Weng, Nanjing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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