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Proceedings Paper

Analysis on how spectrum affects the test of solar cell electrical property
Author(s): Dingpu Liu; Chengying Shi; Haifeng Meng; Yingwei He; Haipeng Li; Liang Xu; Fan Zhou
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Paper Abstract

Nowadays, more attentions may be paied to irradiance and temperature during the electrical performance tests of solar cell and module. But the light spectrum will also largely determine test results. During the electrical performance test, irradiance is generally traced by standard solar cell. Considering that the short circuit current (Isc) is generally used in the testing process as a basis for the irradiance calibration, and the Isc of reference cell consists of spectral distribution of light source and the spectral response of the cell together. So spectral mismatch should be analyzed from this two aspects. Natural light spectrum will be affected by atmospheric conditions and seasons, and artificial solar simulator’s spectrum is differ in thousands ways. Also because of the response wave band of the spectrum range is different, when use standard solar cell or pyranometer as the basis of the irradiance calibration, there should be respectively different results. Beyond that, two cells made of polycrystalline silicon with different spectral response may also leads to different results. We analyzed the deviation based on above factors, and discussed how to reduce the spectral mismatch deviation, then increase the accuracy of the solar cell electrical performance test methods.

Paper Details

Date Published: 13 November 2014
PDF: 6 pages
Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92761G (13 November 2014); doi: 10.1117/12.2070857
Show Author Affiliations
Dingpu Liu, China Academy of Telecommunication Research (China)
Chengying Shi, China Academy of Telecommunication Research (China)
Haifeng Meng, China Academy of Telecommunication Research (China)
Yingwei He, National Institute of Metrology (China)
Haipeng Li, China Academy of Telecommunication Research (China)
Liang Xu, China Academy of Telecommunication Research (China)
Fan Zhou, China Academy of Telecommunication Research (China)


Published in SPIE Proceedings Vol. 9276:
Optical Metrology and Inspection for Industrial Applications III
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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