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Proceedings Paper

Spectral backward Monte Carlo method for surface infrared image simulation
Author(s): Haifeng Sun; Xinlin Xia; Chuang Sun; Xue Chen
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Paper Abstract

The surface infrared radiation is an important part that contributes to the infrared image of the airplane. The Monte Carlo method for the infrared image calculation is suitable for the complex geometry of targets like airplanes. The backward Monte Carlo method is prior to the forward Monte Carlo method for the usually long distance between targets and the detector. Similar to the non-gray absorbing media, the random number relation is developed for the radiation of the spectral surface. In the backward Monte Carlo method, one random number that reverses the wave length (or wave number) may result deferent wave numbers for targets’ surface elements on the track of a photon bundle. Through the manipulation of the densities of a photon bundles in arbitrary small intervals near wave numbers, all the wave lengths corresponding to one random number on the targets’ surface elements on the track of the photon bundle are kept the same to keep the balance of the energy of the photon bundle. The model developed together with the energy partition model is incorporated into the backward Monte Carlo method to form the spectral backward Monte Carlo method. The developed backward Monte Carlo method is used to calculate the infrared images of a simple configuration with two gray spectral bands, and the efficiency of it is validated by compared the results of it to that of the non-spectral backward Monte Carlo method . Then the validated spectral backward Monte Carlo method is used to simulate the infrared image of the SDM airplane model with spectral surface, and the distribution of received infrared radiation flux of pixels in the detector is analyzed.

Paper Details

Date Published: 20 November 2014
PDF: 9 pages
Proc. SPIE 9300, International Symposium on Optoelectronic Technology and Application 2014: Infrared Technology and Applications, 93000L (20 November 2014); doi: 10.1117/12.2070699
Show Author Affiliations
Haifeng Sun, Harbin Institute of Technology (China)
Xinlin Xia, Harbin Institute of Technology (China)
Chuang Sun, Harbin Institute of Technology (China)
Xue Chen, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 9300:
International Symposium on Optoelectronic Technology and Application 2014: Infrared Technology and Applications
Mircea Guina; Haimei Gong; Zhichuan Niu; Jin Lu, Editor(s)

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