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Proceedings Paper

Design and application of FBG strain experimental apparatus in high temperature
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Paper Abstract

Fiber Bragg Grating (FBG) sensing technology has many applications, and it’s widely used in detection of temperature, strain and etc. Now the application of FBG sensor is limited to the temperature below 200°C owing to the so called High Temperature Erasing Phenomenon. Strain detection over 200°C is still an engineering challenge since high temperature has a bad influence on the sensor, testing equipment and test data, etc, thus effective measurement apparatus are needed to ensure the accuracy of the measurement over 200°C, but there are no suitable FBG strain experimental apparatus in high temperature to date. In this paper a high temperature FBG strain experimental apparatus has been designed to detect the strain in high temperature. In order to verify working condition of the high temperature FBG strain, an application of FBG strain sensing experiment was given in this paper. The high temperature FBG strain sensor was installed in the apparatus, the internal temperature of experimental apparatus was controlled from -20 to 300°C accurately, and strain loading was given by the counterweight, then the data was recorded through electrical resistance strain measurement and optical sensing interrogator. Experimental data result shows that the high temperature FBG strain experimental apparatus can work properly over 200°C. The design of the high temperature FBG strain experimental apparatus are demonstrated suitable for high temperature strain gauges and FBG strain sensors , etc, which can work under the temperature of -20 ~ 300°C, the strain of -1500 ~ +1500μepsilon and the wavelength resolution of 1pm.

Paper Details

Date Published: 18 September 2014
PDF: 6 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92821W (18 September 2014); doi: 10.1117/12.2070680
Show Author Affiliations
Zhongcheng Xia, China Jiliang Univ. (China)
Yueming Liu, China Jiliang Univ. (China)
Xiaoliang Gao, China Jiliang Univ. (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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