Share Email Print
cover

Proceedings Paper

Measurement of the temperature distribution inside the power cable using distributed temperature system
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Nowadays, the power cables are manufactured to fulfill the following condition – the highest allowable temperature of the cable during normal operation and the maximum allowable temperature at short circuit conditions cannot exceed the condition of the maximum allowable internal temperature. The distribution of the electric current through the conductor leads to the increase of the amplitude of electrons in the crystal lattice of the cables material. The consequence of this phenomenon is the increase of friction and the increase of collisions between particles inside the material, which causes the temperature increase of the carrying elements. The temperature increase is unwanted phenomena, because it is causing losses. In extreme cases, the long-term overload leads to the cable damaging or fire. This paper deals with the temperature distribution measurement inside the power cables using distributed temperature system. With cooperation with Kabex company, the tube containing optical fibers was installed into the center of power cables. These fibers, except telecommunications purposes, can be also used as sensors in measurements carrying out with distributed temperature system. These systems use the optical fiber as a sensor and allow the continual measurement of the temperature along the whole cable in real time with spatial resolution 1 m. DTS systems are successfully deployed in temperature measurement applications in industry areas yet. These areas include construction, drainage, hot water etc. Their advantages are low cost, resistance to electromagnetic radiation and the possibility of real time monitoring at the distance of 8 km. The location of the optical fiber in the center of the power cable allows the measurement of internal distribution of the temperature during overloading the cable. This measurement method can be also used for prediction of short-circuit and its exact location.

Paper Details

Date Published: 6 January 2015
PDF: 8 pages
Proc. SPIE 9450, Photonics, Devices, and Systems VI, 94500K (6 January 2015); doi: 10.1117/12.2070412
Show Author Affiliations
Jakub Jaros, VŠB-Technical Univ. of Ostrava (Czech Republic)
Andrej Liner, VŠB-Technical Univ. of Ostrava (Czech Republic)
Martin Papes, VŠB-Technical Univ. of Ostrava (Czech Republic)
Vladimir Vasinek, VŠB-Technical Univ. of Ostrava (Czech Republic)
Veleslav Mach, VŠB-Technical Univ of Ostrava (Czech Republic)
David Hruby, VŠB-Technical Univ. of Ostrava (Czech Republic)
Tomas Kajnar, VŠB-Technical Univ. of Ostrava (Czech Republic)
Frantisek Perecar, VŠB-Technical Univ. of Ostrava (Czech Republic)


Published in SPIE Proceedings Vol. 9450:
Photonics, Devices, and Systems VI
Pavel Tománek; Dagmar Senderáková; Petr Páta, Editor(s)

© SPIE. Terms of Use
Back to Top