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Proceedings Paper

Particle deformation induced by AFM tapping under different setpoint voltages
Author(s): Chung-Lin Wu; Natalia Farkas; John A. Dagata; Bo-Ching He; Wei-En Fu
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Paper Abstract

The measured height of polystyrene nanoparticles varies with setpoint voltage during atomic force microscopy (AFM) tapping-mode imaging. Nanoparticle height was strongly influenced by the magnitude of the deformation caused by the AFM tapping forces, which was determined by the setpoint voltage. This influence quantity was studied by controlling the operational AFM setpoint voltage. A test sample consisting of well-dispersed 60-nm polystyrene and gold nanoparticles co-adsorbed on poly-l-lysine-coated mica was studied in this research. Gold nanoparticles have not only better mechanical property than polystyrene nanoparticles, but also obvious facets in AFM phase image. By using this sample of mixed nanoparticles, it allows us to confirm that the deformation resulted from the effect of setpoint voltage, not noise. In tapping mode, the deformation of polystyrene nanoparticles increased with decreasing setpoint voltage. Similar behavior was observed with both open loop and closed loop AFM instruments.

Paper Details

Date Published: 16 September 2014
PDF: 6 pages
Proc. SPIE 9236, Scanning Microscopies 2014, 92360W (16 September 2014); doi: 10.1117/12.2070356
Show Author Affiliations
Chung-Lin Wu, Industrial Technology Research Institute (Taiwan)
Natalia Farkas, National Institute of Standards and Technology (United States)
John A. Dagata, National Institute of Standards and Technology (United States)
Bo-Ching He, Industrial Technology Research Institute (Taiwan)
Wei-En Fu, Industrial Technology Research Institute (Taiwan)


Published in SPIE Proceedings Vol. 9236:
Scanning Microscopies 2014
Michael T. Postek; Dale E. Newbury; S. Frank Platek; Tim K. Maugel, Editor(s)

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