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Proceedings Paper

Scan patterns measurement of a Risley-prism system
Author(s): Yanyan Zhao; Yan Yuan
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Paper Abstract

An exact scan footprint formula of beam refracted by Risley-prism is derived. Based on this, a prototype of a Risley-prism system is designed to prove the exact beam footprint model. A scan patterns measurement method is proposed and measurement apparatus is set up to measure the footprint. The comparison of simulation results and measurement results indicate the correctness of the exact formula and the rationality of the measurement method.

Paper Details

Date Published:
Proc. SPIE 9293, International Optical Design Conference 2014, 92932F; doi: 10.1117/12.2070249
Show Author Affiliations
Yanyan Zhao, Beihang Univ. (China)
Yan Yuan, Beihang Univ. (China)

Published in SPIE Proceedings Vol. 9293:
International Optical Design Conference 2014
Mariana Figueiro; Scott Lerner; Julius Muschaweck; John Rogers, Editor(s)

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