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Proceedings Paper

Numerical simulations of surface plasmon resonances in metal-chalcogenide waveguides
Author(s): Mihai Stafe; Georgiana C. Vasile; Aurelian A. Popescu; Dan Savastru; Laurentiu Baschir; Mona Mihailescu; Constantin Negutu; Niculae N. Puscas
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Paper Abstract

In this paper we present several numerical simulations of the surface plasmon resonance for Kretschmann type configuration in a metal-chalcogenide waveguide. We assume that the chalcogenide (GaLaS) waveguide layer have finite thickness, whereas the gold film layer and the air cover layer are semi-infinite layers (from an optical point of view). We determined the thickness of the chalcogenide film for which plasmonic resonant coupling of the incident radiation to the waveguide occurs. We calculated the propagation constant for the TE- and TM- modes (both for visible and IR domain), the attenuation coefficient and the electromagnetic field distribution within the waveguide. The obtained results provide the conditions for design an optical memory device 2D based on light-light interaction in plasmonic configuration.

Paper Details

Date Published: 20 February 2015
PDF: 7 pages
Proc. SPIE 9258, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VII, 92582H (20 February 2015); doi: 10.1117/12.2070182
Show Author Affiliations
Mihai Stafe, Politehnica Univ. of Bucharest (Romania)
Georgiana C. Vasile, Politehnica Univ. of Bucharest (Romania)
Aurelian A. Popescu, National Institute of Research and Development for Optoelectronics (Romania)
Dan Savastru, National Institute of Research and Development for Optoelectronics (Romania)
Laurentiu Baschir, National Institute of Research and Development for Optoelectronics (Romania)
Mona Mihailescu, Politehnica Univ. of Bucharest (Romania)
Constantin Negutu, Politehnica Univ. of Bucharest (Romania)
Niculae N. Puscas, Politehnica Univ. of Bucharest (Romania)


Published in SPIE Proceedings Vol. 9258:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VII
Ionica Cristea; Marian Vladescu; Razvan Tamas, Editor(s)

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