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Proceedings Paper

Accurate and flexible calibration technique for fringe projection profilometry by using encoded points and Fourier analysis
Author(s): Andrés L. González; Carlos R. Contreras; Jaime E. Meneses
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Paper Abstract

In order to get measures with a high accurate, three-dimensional reconstruction systems are implemented in industrial, medical, and investigative fields. To obtain high accurate is necessary to carry out an appropriate calibration procedure. In fringe projection profilometry, this procedure allows obtaining a relation between absolute phase and three-dimensional (3D) information of the object in study; however, to execute such procedure a precise movement stage is required. A fringe projection system is formed by a projector, a digital camera and a control unit, called like a projection-acquisition unit in this paper. The calibration of the projection-acquisition unit consists in to establish the parameters that are required to transform the phase of the projected fringes to metric coordinates of the object surface. These parameters are a function of the intrinsic and extrinsic parameters of both camera and projector, due to the projector is modeled as an inverse camera. For this purpose, in this paper a novel and flexible calibration method that allows calibrating any device that works with fringe projection profilometry is proposed. In this method is used a reference plane placed in random positions and the projection of an encoded pattern of control points. The camera parameters are computed using Zhang’s calibration method; and the projector parameters are computed from the camera parameters and the phase of the pattern of control points, which is determined by using Fourier analysis. Experimental results are presented to demonstrate the performance of the calibration method.

Paper Details

Date Published: 5 June 2014
PDF: 7 pages
Proc. SPIE 9110, Dimensional Optical Metrology and Inspection for Practical Applications III, 91100X (5 June 2014); doi: 10.1117/12.2069929
Show Author Affiliations
Andrés L. González, Univ. Industrial de Santander (Colombia)
Carlos R. Contreras, Univ. Industrial de Santander (Colombia)
Jaime E. Meneses, Univ. Industrial de Santander (Colombia)

Published in SPIE Proceedings Vol. 9110:
Dimensional Optical Metrology and Inspection for Practical Applications III
Kevin G. Harding; Toru Yoshizawa, Editor(s)

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