Share Email Print
cover

Proceedings Paper

Image processing of metal surface with structured light
Author(s): Cong Luo; Chang Feng; Congzheng Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In structured light vision measurement system, the ideal image of structured light strip, in addition to black background , contains only the gray information of the position of the stripe. However, the actual image contains image noise, complex background and so on, which does not belong to the stripe, and it will cause interference to useful information. To extract the stripe center of mental surface accurately, a new processing method was presented. Through adaptive median filtering, the noise can be preliminary removed, and the noise which introduced by CCD camera and measured environment can be further removed with difference image method. To highlight fine details and enhance the blurred regions between the stripe and noise, the sharping algorithm is used which combine the best features of Laplacian operator and Sobel operator. Morphological opening operation and closing operation are used to compensate the loss of information.Experimental results show that this method is effective in the image processing, not only to restrain the information but also heighten contrast. It is beneficial for the following processing.

Paper Details

Date Published: 2 September 2014
PDF: 7 pages
Proc. SPIE 9280, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 928019 (2 September 2014); doi: 10.1117/12.2069921
Show Author Affiliations
Cong Luo, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Chang Feng, Institute of Optics and Electronics (China)
Congzheng Wang, Institute Of Optics And Electronics (China)


Published in SPIE Proceedings Vol. 9280:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Wenhan Jiang; Myung K. Cho; Fan Wu, Editor(s)

© SPIE. Terms of Use
Back to Top