Share Email Print
cover

Proceedings Paper

Experimental study on elliptical vibration cutting for optical microstructures
Author(s): Guo Li; Lin Che; Bo Wang; Fei Ding; Chen Feng Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In the processing technology of optical microstructure, mechanical processing with high efficiency and quality is still dominating. However, with microstructure surface quality higher and higher, the precision and ultra precision cutting technology has been difficult to meet the needs of reality, and it still remains a big issue in production efficiency and cost. In this case, the elliptical vibration cutting method is created. At present, research on the effect of elliptical vibration cutting on surface quality of microstructures with special optical properties such as V-groove, micro pyramid and sinusoidal grid surface is rarely seen. This paper focuses on the elliptical vibration cutting process of arc groove and V-groove, aiming at finding the discipline of various parameters (frequency, amplitude, feed rate) and analyzing the surface quality through experiments. Firstly, the principle of elliptical vibration cutting is introduced, the cutting mechanism and the theoretical error are analyzed, and a vibration cutting system is designed for precision machining. Because the surface quality and burr play have a huge impact on optical microstructure, effects of the vibration frequency (0-2kHz), amplitude (0.5-2.5μm) as well as feed rate (6-30mm/min) on surface quality and burr suppression are analyzed. The experimental results show that compared to normal cutting, elliptical vibration cutting has obvious advantages. With the increases of the frequency and amplitude, the surface quality improves significantly, the surface roughness is changed from 61.5nm to 25.3nm, and burr has been suppressed to some extent.

Paper Details

Date Published: 21 August 2014
PDF: 9 pages
Proc. SPIE 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 928304 (21 August 2014); doi: 10.1117/12.2069915
Show Author Affiliations
Guo Li, Harbin Institute of Technology (China)
Lin Che, Harbin Institute of Technology (China)
Bo Wang, Harbin Institute of Technology (China)
Fei Ding, Harbin Institute of Technology (China)
Chen Feng Zhang, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 9283:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Tianchun Ye; A. G. Poleshchuk; Song Hu, Editor(s)

© SPIE. Terms of Use
Back to Top