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Proceedings Paper

Design and characterization of a large aperture spectral radiance source integrating sphere for calibration of satellite remote sensors
Author(s): Houping Wu; Yingwei He; Chundi Zheng; Guojin Feng; Chi Chen; Wei Dong; Ping Li; Yu Wang
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Paper Abstract

A large aperture uniform radiation source integrating sphere (URSIS) based on a 4m diameter internally illuminated integrating sphere with a 1.6m diameter exit port was designed and manufactured. This URSIS was used for pre-launch test and radiance calibration of large aperture imaging radiometers which fly aboard earth-borne remote satellites. Design criteria of the large aperture URSIS including sphere source radiance output, spatial radiance uniformity and radiance stability were presented. Integrating sphere internal lamp sources specifications and sphere coating selection were also concerned to suit the requirements of the multi-spectral-band imaging remote sensors. A new radiance calibration method of the URSIS based on Re-C blackbody was applied. The radiance calibration uncertainties varied from 2.8% to 3.5% with a coverage factor k=2 were achieved. The spectral radiance of the large aperture URSIS was characterized in the wavelength region from blue to near-infrared of spectrum. The spatial radiance uniformity of the large aperture URSIS was better than 99.0% and the stability was better than 0.4% over a period of 2 hours after an initial 30 minutes warm-up.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 928226 (18 September 2014); doi: 10.1117/12.2069881
Show Author Affiliations
Houping Wu, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Chundi Zheng, National Institute of Metrology (China)
Guojin Feng, National Institute of Metrology (China)
Chi Chen, National Institute of Metrology (China)
Wei Dong, National Institute of Metrology (China)
Ping Li, National Institute of Metrology (China)
Yu Wang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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