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Proceedings Paper

Discussion on a method of target’s infrared feature extraction
Author(s): Wenxing Tian; Qiang Li; Jingneng Fu; Lanfang Cui
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Paper Abstract

Infrared characteristics of the target show some surface features of targets. By analyzing the infrared characteristics of the targets, specific properties and working condition of targets can be obtained. By studying the methods of the infrared properties of the targets, we can get a method of extracting the target surface characteristics. Actual spectral irradiance is calculated according to the dimension reduction and target’s infrared signal. Optimization model can be obtained by matching the theoretical formula of target’s irradiance with actual spectral irradiance. Equivalent temperature and equivalent area of target can be calculated by optimization methods.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92823A (18 September 2014); doi: 10.1117/12.2069847
Show Author Affiliations
Wenxing Tian, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Qiang Li, Institute of Optics and Electronics (China)
Jingneng Fu, Institute of Optics and Electronics (China)
Lanfang Cui, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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