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Proceedings Paper

Research on polarizing performance of Au-SiO2 sub-wavelength hybrid grating in short wave infrared (SWIR)
Author(s): Wang Rui; Tao Li; Xiumei Shao; Xue Li; Haimei Gong
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Paper Abstract

Nanowire grating is designed within the wavelength range from 1μm to 3μm according to the sensitive wavelength of InGaAs short wave infrared (SWIR) detector. The polarization performance is analyzed on the basis of finite difference time domain (FDTD) method. In order to improve the polarization performance, we insert a SiO2 dielectric grating between metal grating and substrate to form Au-SiO2 hybrid grating. The numerical study shows transmittance of hybrid grating is almost 88%which is 18% higher than monolayer metal grating at 1.8μm. In addition, the hybrid grating with the grooved- SiO2 layer has higher transmittance efficiency than those with smooth SiO2 layer for special wave band. By optimizing the specific parameters of the hybrid grating such as period, thickness and the groove depth of SiO2, finally we obtain the optimal parameters of the designed hybrid grating: the grating period is 0.4 μm, the thickness and groove depth of SiO2 are 0.4μm and 0.1μm respectively. Numerical study shows that the designed grating has advantages of wide band, high transmittance efficiency and high extinction ratio.

Paper Details

Date Published: 2 September 2014
PDF: 6 pages
Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 928403 (2 September 2014); doi: 10.1117/12.2069791
Show Author Affiliations
Wang Rui, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Tao Li, Shanghai Institute of Technical Physics (China)
Xiumei Shao, Shanghai Institute of Technical Physics (China)
Xue Li, Shanghai Institute of Technical Physics (China)
Haimei Gong, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 9284:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
Yadong Jiang; Junsheng Yu; Bernard Kippelen, Editor(s)

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