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Proceedings Paper

Vibration analysis of the Thomson Scattering diagnostics optical transmission system on EAST tokamak
Author(s): Chunqiang Shao; Qing Zang; Junyu Zhao; Ailan Hu; Xiaofeng Han; Hui Chen; Liangliang He; Tengfei Wang
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Paper Abstract

A series of vibration source from the EAST tokamak complicated experimental environment would result in the laser path misalignment and the collected scattered laser signal attenuation, which leads to a measurement error of the Thomson Scattering (TS) diagnostics system. Two methods have been designed for the vibration analysis of the TS diagnostics optical transmission system, a passive one and an active one. The optical transmission system contains of a double deck optical table with 4 reflectors and a photon collection system. The vibration analysis includes 4 points of reflectors along the laser path, 1 point of the photon collection system, and the ground of EAST experimental hall. The passive method used a vibration spectrum analyzer and 7 vertical speed sensors measuring the standard deviation of the vibration noise, which refers to the virtual value of vibration, and a data analysis system. The active method used a hammer to simulate the vibration source of the experimental hall ground, and 15 accelerometers to measure the three-dimensional vibration spectrum of 5 points along the optical transmission system. The vibration isolation efficiency (IE) of the optical transmission system has been presented, and the vibration asynchrony of the 5 points also has been observed. The results of two methods are comparatively studied, and the active one is considered to be more credible.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92822Z (18 September 2014); doi: 10.1117/12.2069768
Show Author Affiliations
Chunqiang Shao, Institute of Plasma Physics (China)
Qing Zang, Institute of Plasma Physics (China)
Junyu Zhao, Institute of Plasma Physics (China)
Ailan Hu, Institute of Plasma Physics (China)
Xiaofeng Han, Institute of Plasma Physics (China)
Hui Chen, Institute of Plasma Physics (China)
Liangliang He, Institute of Plasma Physics (China)
Tengfei Wang, Institute of Plasma Physics (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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