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Proceedings Paper

Research on mid-frequency errors in Nd-doped glass continuous polishing
Author(s): Jun Cao; Aihuan Dun; Chaoyang Wei; Jianxun Gu; Jianda Shao
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Paper Abstract

In the inertial confinement fusion (ICF) system, the mid-frequency errors of optical components will cause high-frequency modulation and nonlinear gain of laser beams. In this paper, theoretical simulations and experiments have been designed and operated, aiming at studying the effects of slotting methods on mid-frequency errors in Nd-doped glass continuous polishing. Based on Preston formula, theoretical simulations focus on the effects of slotting methods on the mid-frequency errors. The simulation results show that different slotting methods will cause different mid-frequency errors, and square and logarithmic shape grooves are easier to obtain smaller mid-frequency errors. On the basis of simulation results, two groups of experiments are carried out to do the Nd-doped glass continuous polishing. The results show that the mid-frequency error gradually decreases with the decrease of the spacing between grooves. The results also show that square shape groove is easier to get a smaller mid-frequency error than circular shape groove, which verifies the theoretical simulation results.

Paper Details

Date Published: 6 August 2014
PDF: 8 pages
Proc. SPIE 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 92810K (6 August 2014); doi: 10.1117/12.2069765
Show Author Affiliations
Jun Cao, Shanghai Institute of Optics and Fine Mechanics (China)
Aihuan Dun, Shanghai Institute of Optics and Fine Mechanics (China)
Chaoyang Wei, Shanghai Institute of Optics and Fine Mechanics (China)
Jianxun Gu, Shanghai Institute of Optics and Fine Mechanics (China)
Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 9281:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Eric Ruch; Shengyi Li, Editor(s)

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