Share Email Print
cover

Proceedings Paper

Laboratory radiometric calibration for the convex grating imaging spectrometer
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The radiometric calibration of imaging spectrometer plays an import role for scientific application of spectral data. The radiometric calibration accuracy is influenced by many factors, such as the stability and uniformity of light source, the transfer precision of radiation standard and so on. But the deviation from the linear response mode and the polarization effect of the imaging spectrometer are always neglected. In this paper, the linear radiometric calibration model is constructed and the radiometric linear response capacity is test by adjusting electric gain, exposure time and radiance level. The linear polarizer and the sine function fitting algorithm are utilized to measure polarization effect. The integrating sphere calibration system is constructed in our Lab and its spectral radiance is calibrated by a well-characterized and extremely stable NIST traceable transfer spectroradiometer. Our manufactured convex grating imaging spectrometer is relative and absolute calibrated based on the integrating sphere calibration system. The relative radiometric calibration data is used to remove or reduce the radiometric response non-uniformity every pixel of imaging spectrometer while the absolute radiometric calibration is used to construct the relationship between the physical radiant of the scene and the digital number of the image. The calibration coefficients are acquired at ten radiance levels. The diffraction noise in the images can be corrected by the calibration coefficients and the uniform radiance image can be got. The calibration result shows that our manufactured imaging spectrometer with convex grating has 3.0% degree of polarization and the uncertainties of the relative and absolute radiometric calibrations are 2.4% and 5.6% respectively.

Paper Details

Date Published: 18 September 2014
PDF: 8 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92822G (18 September 2014); doi: 10.1117/12.2069732
Show Author Affiliations
Jiankang Zhou, Soochow Univ. (China)
Xinhua Chen, Soochow Univ. (China)
Yuheng Chen, Soochow Univ. (China)
Yiqun Ji, Soochow Univ. (China)
Weimin Shen, Soochow Univ. (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

© SPIE. Terms of Use
Back to Top