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Proceedings Paper

A new method of field MRTD test
Author(s): Zhibin Chen; Yan Song; Xianhong Liu; Wenjian Xiao
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Paper Abstract

MRTD is an important indicator to measure the imaging performance of infrared camera. In the traditional laboratory test, blackbody is used as simulated heat source which is not only expensive and bulky but also difficult to meet field testing requirements of online automatic infrared camera MRTD. To solve this problem, this paper introduces a new detection device for MRTD, which uses LED as a simulation heat source and branded plated zinc sulfide glass carved four-bar target as a simulation target. By using high temperature adaptability cassegrain collimation system, the target is simulated to be distance-infinite so that it can be observed by the human eyes to complete the subjective test, or collected to complete objective measurement by image processing. This method will use LED to replace blackbody. The color temperature of LED is calibrated by thermal imager, thereby, the relation curve between the LED temperature controlling current and the blackbody simulation temperature difference is established, accurately achieved the temperature control of the infrared target. Experimental results show that the accuracy of the device in field testing of thermal imager MRTD can be limited within 0.1K, which greatly reduces the cost to meet the project requirements with a wide application value.

Paper Details

Date Published: 18 September 2014
PDF: 5 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92822Q (18 September 2014); doi: 10.1117/12.2069727
Show Author Affiliations
Zhibin Chen, Mechanical Engineering College (China)
Yan Song, Mechanical Engineering College (China)
Xianhong Liu, Mechanical Engineering College (China)
Wenjian Xiao, Mechanical Engineering College (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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