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Proceedings Paper

The optical-mechanical design of DMD modulation imaging device
Author(s): Tianting Li; Xiping Xu; Yang Qiao; Lei Li; Yue Pan
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Paper Abstract

In order to avoid the phenomenon of some image information were lost, which is due to the jamming signals, such as incident laser, make the pixels dot on CCD saturated. In this article a device of optical-mechanical structure was designed, which utilized the DMD (Digital Micro mirror Device) to modulate the image. The DMD reflection imaging optical system adopts the telecentric light path. However, because the design is not only required to guarantee a 66° angle between the optical axis of the relay optics and the DMD, but also to ensure that the optical axis of the projection system keeps parallel with the perpendicular bisector of the micro-mirror which is in the "flat" state, so the TIR prism is introduced,and making the relay optics and the DMD satisfy the optical institution’s requirements. In this paper, a mechanical structure of the imaging optical system was designed and at the meanwhile the lens assembly has been well connected and fixed and fine-tuned by detailed structural design, which included the tilt decentered lens, wedge flanges, prisms. By optimizing the design, the issues of mutual restraint between the inverting optical system and the projecting system were well resolved, and prevented the blocking of the two systems. In addition, the structure size of the whole DMD reflection imaging optical system was minimized; it reduced the energy loss and ensured the image quality.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 92822M (18 September 2014); doi: 10.1117/12.2069701
Show Author Affiliations
Tianting Li, Changchun Univ. of Science and Technology (China)
Xiping Xu, Changchun Univ. of Science and Technology (China)
Yang Qiao, Changchun Univ. of Science and Technology (China)
Lei Li, Changchun Univ. of Science and Technology (China)
Yue Pan, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9282:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Wei Gao, Editor(s)

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