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Proceedings Paper

Analysis of electric vacuum characteristics of MCP
Author(s): Xiang Gao; Feng Shi; Hong-chang Cheng; Lei Yin; Zhuang Miao; Xing Cheng; Long Wang; Sen Niu
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Paper Abstract

In order to improve the electronic gain and luminance gain of low-light-level image intensifiers, microchannel plates(MCP) are adopted as the electron multiplier mechanism. According to the relevant experimental analysis, the resistance between channels is a limited value. Due to there are resistive coupling between any two adjacent channel of MCP, the electron transmission and the electron multiplication in a certain channel will be interfered by its adjacent channels, This phenomenon would affect the quality of image transmission and field of view of image intensifier. In low-light condition, the input current of MCP is small, the current gain of each channel is same, MCP has the area of linear current amplification and distortion-free image transmission. But when input current is large and close to saturation, lower current in channels has more current gain, leading to the contrast change of the image. This paper analyzes the transmission properties of electrons in the channels. It is proved that there is an electrical relationship between adjacent channels,throuht the circuit equations with relevant circuit parameters such as the resistance of secondary electron emission layer, resistance of resistive layer, the resistance between two adjacent channels, and so on. The analysis method and research results provide technical guidance for the improvement of electronic gain, luminance uniformity and preparation process of MCP.

Paper Details

Date Published: 2 September 2014
PDF: 6 pages
Proc. SPIE 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging, 928411 (2 September 2014); doi: 10.1117/12.2069628
Show Author Affiliations
Xiang Gao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Feng Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Hong-chang Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Lei Yin, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Xing Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Long Wang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)
Sen Niu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night Vision Technology Group Co., Ltd. (China)


Published in SPIE Proceedings Vol. 9284:
7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
Yadong Jiang; Junsheng Yu; Bernard Kippelen, Editor(s)

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